Stanford Root

Schedule

Stanford Root

Schedule

MATSCI 320

Nanocharacterization of Materials

UNITS:3
GRADING:Letter or Credit/No Credit
LEVEL:Graduate
GER:—

Current methods of directly examining the microstructure of materials. Topics: optical microscopy, scanning electron and focused ion beam microscopy, field ion microscopy, transmission electron microscopy, scanning probe microscopy, and microanalytical surface science methods. Emphasis is on the electron-optical techniques. Recommended: MATSCI 193/MATSCI 203.

Syllabus for selected term:
View Spring 2027 Syllabus

Sections

1 Term
Lecture 1Open
ID: 27011
0 / 90 enrolled
DAYS:Tuesday, Thursday
TIME:3 PM – 4:20 PM
LOCATION:TBD
3units

MATSCI 320: Nanocharacterization of Materials

3 units · Letter or Credit/No Credit

Current methods of directly examining the microstructure of materials. Topics: optical microscopy, scanning electron and focused ion beam microscopy, field ion microscopy, transmission electron microscopy, scanning probe microscopy, and microanalytical surface science methods. Emphasis is on the electron-optical techniques. Recommended: 193/203.

Offered in Spring 2027 at Stanford University.

Spring 2027 sections

  • Lecture — Tuesday Thursday 3:00 PM – 4:20 PM (Graduate)

More MATSCI courses

  • MATSCI 251: Microstructure and Mechanical Properties (MATSCI 151)
  • MATSCI 256: Solar Cells, Fuel Cells, and Batteries: Materials for the Energy Solution
  • MATSCI 299: Practical Training
  • MATSCI 300: Ph.D. Research
  • MATSCI 303: Principles, Materials and Devices of Batteries
  • MATSCI 317: Defects in semiconductors
  • MATSCI 321: Transmission Electron Microscopy
  • MATSCI 322: Transmission Electron Microscopy Laboratory
  • MATSCI 323: Thin Film and Interface Microanalysis
  • MATSCI 324: Optics of Microscope Design for Materials (PHOTON 324)
  • MATSCI 326: X-Ray Science and Techniques (PHOTON 326)
  • MATSCI 327: Transmission Electron Microscopy Analysis and Simulation

All MATSCI courses · All departments