Experimental x-ray diffraction techniques for microstructural analysis of materials, emphasizing powder and single-crystal techniques. Diffraction from epitaxial and polycrystalline thin films, multilayers, and amorphorous materials using medium and high resolution configurations. Determination of phase purity, crystallinity, relaxation, stress, and texture in the materials. Advanced experimental x-ray diffraction techniques: reciprocal lattice mapping, reflectivity, and grazing incidence diffraction. Enrollment limited to MATSCI 20. Undergraduates register for MATSCI 162 for 4 units; graduates register for MATSCI 172 for 3 units. Prerequisites: MATSCI MATSCI 143 or equivalent course in materials characterization.Corequisites: MATSCI131 (Contact the instructor if you would like to enroll without completion of the stated prerequisites. A permission code will be provided with instructor approval)
3-4 units · Letter or Credit/No Credit · GER: WAY-AQR, WAY-SMA, WIM
Experimental x-ray diffraction techniques for microstructural analysis of materials, emphasizing powder and single-crystal techniques. Diffraction from epitaxial and polycrystalline thin films, multilayers, and amorphorous materials using medium and high resolution configurations. Determination of phase purity, crystallinity, relaxation, stress, and texture in the materials. Advanced experimental x-ray diffraction techniques: reciprocal lattice mapping, reflectivity, and grazing incidence diffraction. Enrollment limited to 20. Undergraduates register for 162 for 4 units; graduates register for 172 for 3 units. Prerequisites: MATSCI 143 or equivalent course in materials characterization.Corequisites: MATSCI131 (Contact the instructor if you would like to enroll without completion of the stated prerequisites. A permission code will be provided with instructor approval)
Offered in Spring 2027 at Stanford University.